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X-Ray Fluorescence Spectrometry

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<p>X-ray fluorescence spectroscopy, one of the most powerful and flexible techniques available for the analysis and characterization of materials today, has gone through major changes during the past decade.</p> <p>Fully revised and expanded by 30%, <i>X-Ray Fluorescence Spectrometry</i>, Second Edition incorporates the latest industrial and scientific trends in all areas. It updates all previous material and adds new chapters on such topics as the history of X-ray fluorescence spectroscopy, the design of X-ray spectrometers, state-of-the-art applications, and X-ray spectra.</p> <p>Ron Jenkins draws on his extensive experience in training and consulting industry professionals for this clear and concise treatment, covering first the basic aspects of X rays, then the methodology of X-ray fluorescence spectroscopy and available instrumentation. He offers a comparison between wavelength and energy dispersive spectrometers as well as step-by-step guidelines to X-ray spectrometric techniques for qualitative and quantitative analysis-from specimen preparation to real-world industrial application.</p> <p>Favored by the American Chemical Society and the International Centre for Diffraction Data, <i>X-Ray Fluorescence Spectrometry</i>, Second Edition is an ideal introduction for newcomers to the field and an invaluable reference for experienced spectroscopists-in chemical analysis, geology, metallurgy, and materials science.</p> <p>An up-to-date review of X-ray spectroscopic techniques. This proven guidebook for industry professionals is thoroughly updated and expanded to reflect advances in X-ray analysis over the last decade. X-Ray Fluorescence Spectrometry, Second Edition includes:</p> <ul> <li>The history of X-ray fluorescence spectrometry-new to this edition.</li> <li>A critical review of the most useful X-ray spectrometers.</li> <li>Techniques and procedures for quantitative and qualitative analysis.</li> <li>Modern applications and industrial trends.</li> <li>X-ray spectra-new to this edition.</li> </ul>

X-Ray Fluorescence Spectrometry

Blick ins Buch

  • Autor: Ron Jenkins
  • Seitenzahl: 232
  • Format: PDF
  • DRM: hard-drm (mit Kopierschutz)
  • Erscheinungsdatum: 29.08.2012
  • Herausgeber: WILEY
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